Design of a fast speckle wavemeter with optical processing

We present a design concept for speckle-based wavemeter that combines high spectral resolution and fast response times. Our device uses fixed disperse medium with small coherence length as an optical pre-processor series of programmable elements post-processor. The generates complex speckle pattern given correlation length, then the post-processor transforms field to simple binary intensity proportional wavelength deviation from reference value. show how construct can be trained produce electrical signal on balanced detector wavelength. Also, we demonstrate operate sub-picometer up nanometer using in picometer range. More generally, our results use low enhanced by higher one.